view article

Figure 6
Method 3: orientation change. Validation for grain-scale plastic events detected using Methods 1 and 2 in Figs. 4 and 5, where Grains A, B and C show examples of Case 1, Case 2 and no event, respectively. (a) Orientations of Grains A, B and C on an IPF aligned with the loading direction. (b)–(d) The orientation of each grain during creep loading in enlarged subsets of the IPF. Each marker represents an ff-HEDM measurement and is colored by the loading time. Δϕ is the total orientation change from before to after an event.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds