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Figure 7
Method 4: diffraction peak shape change. Validation for grain-scale plastic events detected using Methods 1 and 2 in Figs. 4 and 5, where Grains A, B and C show examples of Case 1, Case 2 and no event, respectively. (a) Each grain analyzed will form different diffraction peaks at different angles for different crystal planes. (b) Each diffraction peak can be described as all the illuminated pixels in the 3D space defined by the detector x and y directions and ω, the rotation direction. The shape of the peak can be characterized by three eigenvalues (λi) and eigenvectors (vi) obtained from PCA. (c)–(e) During plastic events, eigenvalues increase, indicating peak broadening. Shown here is the eigenvalue change for the [[\overline{1} 1 0 \overline{1}]] diffraction spot for Grains A, B and C.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1712-1727
https://doi.org/10.1107/S1600576725007009
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