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Figure 15
The 17.3° 2θ peak from experimental PXRD patterns of control samples (dashed lines) and calibration data (solid lines) for the IN-SS manual data set. (a) Control samples with 0.5 FA (S3, S4) and calibration samples with 0.4 and 0.6 FA. (b) Control samples with 0.7 FA (S5, S6) and calibration samples with 0.6 and 0.8 FA.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1700-1711
https://doi.org/10.1107/S1600576725006910
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