SUNBIM 4.0 software: new developments in small- and wide-angle X-ray scattering data analysis for scanning mode and grazing-incidence geometry

Scattarella, F.; Altamura, D.; Sibillano, T.; De Caro, L.; Siliqi, D.; Giannini, C.

doi:10.1107/S1600576725005904

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
Schematic representation of the .edf data conversion procedure. As indicated in the figure, the upload of binary masks for scattering and transmission data is optional.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 5| October 2025| Pages 1817-1826

https://doi.org/10.1107/S1600576725005904

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