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Figure 1
Experimental arrangement for the measurement of anomalous XRPD using a scanning flat-panel detector, showing how it is interleaved with transmission XAS. (a) The mounting of the flat-panel detector and ion chambers on independent arms on one axis (in the direction of the X-ray beam) of a six-circle Huber diffractometer. (b) and (c) Schematic representations indicating the direction and range of movement of the flat-panel (Pilatus) detector.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
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