view article
Figure 2
Comparison of the Si(111) reflection obtained from an Si NIST640c standard on beamlines BM28 (XMaS) at the ESRF (red), MS-X04SA at the Swiss Light Source (blue) and ID22 at the ESRF (green). Both MS-X04SA and ID22 are undulator-based beamlines that use Si(111) channel-cut monochromators, whereas the post-ESRF-upgrade XMaS is founded upon a 0.86 T `short bend' and uses a cryogenically cooled Si(111) double-crystal monochromator. In the case of the MS-X04SA beamline a MYTHEN II detector was used. On ID22 a scanning multicrystal analyser stage was used, whereas the results from XMaS were achieved through scanning a 2D detector through the required angular range. Measurements on ID22 and XMaS were also made after the recent ESRF upgrade.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1778-1788
https://doi.org/10.1107/S1600576725007022
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS