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Figure 3
Rietveld refinement profiles (solid symbols) for Cu-MAZ zeolite during activation under flowing O2 at 275°C on XMaS and restored from a sequence of images collected using a scanned 2D imaging detector for the three X-ray wavelengths used in this study: λ = 0.7081 Å (17.5 keV), λ = 1.3829 Å (8.97 keV) and λ = 1.3880 Å (8.94 keV). Fits to the data derived in TOPAS are given in black.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1778-1788
https://doi.org/10.1107/S1600576725007022
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