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Figure 1
(a) Schematic view and (b) stereographic representation of the horizontal two-detector configuration. Elements belonging to detector D1 (D2) are represented in red (blue). In the initial setup shown here, the sample coordinate system [\left\{{\bf S}\right\}] coincides with the laboratory system [\left\{{\bf L}\right\}]. The diffraction plane spanned by the primary beam (PB) and by the two beams diffracted into detectors D1 and D2 contains the two scattering vectors [{\bf SV}_{1}] and [{\bf SV}_{2}]. Symmetric/asymmetric diffraction conditions are assumed for detector D1/D2, which are characterized by [{\bf SV}_{1}\parallel{\bf L}_{3}] and [\angle{(}{\bf SV}_{2},{\bf L}_{3}{)} = \Delta\theta = \theta_{2}- \theta_{1}], respectively. For further details, see the main text.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1753-1763
https://doi.org/10.1107/S1600576725007599
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