Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 10
Stereographic projections showing the orientation of the two scattering vectors
and
during the
χ
scans covering
in the different azimuths with respect to the residual stress components that occur in the near-surface zone.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58
|
Part 5
|
October 2025
|
Pages 1753-1763
https://doi.org/10.1107/S1600576725007599
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