view article
Figure 13
Near-surface residual stress depth profiles in real (z) and Laplace (τ) space of the analyzed specimen. The shaded areas mark the confidence intervals in the Laplace space, which comprise 95% of the discrete data points. The double arrows denote the information depths covered by the two detectors D1 and D2.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1753-1763
https://doi.org/10.1107/S1600576725007599
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS