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Figure 2
The horizontal two-detector configuration for an inclined sample orientation, realized by a χ tilt around an axis defined by the intersection line between the sample surface and the diffraction plane. (a) Schematic view and (b) stereographic representation of the setup. For the descriptions of the axes and angles, see Fig. 1[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1753-1763
https://doi.org/10.1107/S1600576725007599
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