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Figure 1
(A) Schematic image of the experimental setup. (B) SEM image of the top part of the micropillar with marked scanned area and corresponding step size during scans.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 1| February 2026| Pages 85-92
https://doi.org/10.1107/S160057672500946X
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