view article
Figure 8
(a) Bright-field TEM image of the Mo film deposited on the (011)-oriented MgO substrate. The Pt cover layer stems from the FIB sample preparation. (b) SAED pattern obtained from the area marked by the large dashed circle in panel (a). Diffraction spots from the first orientation variant are labelled in normal script and diffraction spots from the second variant in italics. Non-indexed diffraction spots (two of them are highlighted by small dashed orange circles) correspond to double reflections. (c) and (d) HRTEM images of the areas marked by squares in (a). Circles mark the beam positions during the acquisition of the CBED patterns shown in panel (e). The zone axes of the SAED and CBED patterns are Mathematical equation.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 1| February 2026| Pages 190-205
https://doi.org/10.1107/S1600576726000233
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS