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Figure 11
pathSQE application to a SnS single-crystal dataset measured with the CNCS spectrometer. (a) Unit cell and (b) BZ of SnS. (c) In-plane and (d) out-of-plane elastic maps measured on CNCS at 295 K with Ei = 17 meV. pathSQE BZ-folded data (e) in top-ranked BZ [−6, 0, 1] and (f) across all 65 BZs above the 0.2 fractional coverage threshold. Inelastic spectra were processed using Qdim1,step = 0.025 r.l.u, E = [0, 0.2, 17] meV and Qdim2,int = Qdim3,int = 0.05 r.l.u.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 1| February 2026| Pages 248-262
https://doi.org/10.1107/S1600576725011112
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