The moving-beam diffraction geometry: the DIAD application of a diffraction scanning probe

Leonardi, A.; James, A.; Reinhard, C.; Drakopoulos, M.; Williams, B.; Dehyle, H.; Filik, J.; Perera, L.; Ahmed, S.

doi:10.1107/S1600576725009811

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 3
The moving-beam diffraction geometry. The beam ( $[{{{\hat {\bf s}}}_0}]$ ) incident on the sample (green shadow) is shifted by δ to $[{{\hat {\bf s}}}'_0]$ while the detector position and orientation is constant (yellow plane, $[\pi]$ ). Although the detector distance d from the sample is not affected, the detector pixels will experience a relative change of their position from p to p′ because of the alteration of the diffraction geometry. For a given detector pixel, the scattered vector, $[{{\hat {\bf s}}}]$ , changes to $[{{{\hat {\bf s}}}'}]$ , affecting the angle relative to the incident beam (i.e. 2 $[\theta]$ to 2 $[\theta']$ ). This causes a shift in the recorded Q parameter.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 1| February 2026| Pages 12-27

https://doi.org/10.1107/S1600576725009811

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page