Impact of substrate curvature on grazing-incidence small-angle X-ray scattering signal: theory and example of Ag thin-film growth

Kamiński, M.; Krause, B.; Abadias, G.; Coati, A.; Garreau, Y.; Michel, A.; Resta, A.; Solanki, K.; Vlad, A.; Babonneau, D.

doi:10.1107/S1600576725010726

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 1
The geometry of the GISAXS experiment for the case of a flat sample. On the right the footprint of the rectangular incident X-ray beam on the sample surface is depicted schematically. For more details see the text.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 1| February 2026| Pages 93-107

https://doi.org/10.1107/S1600576725010726

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page