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Figure 14
The evolution of cuts through the 2D GISAXS pattern during deposition of Ag: (a) horizontal cut at the Yoneda peak; (b) vertical cut at the interference peak. The inset in (a) shows an exemplary GISAXS pattern with the integration regions indicated by red lines. The inset in (b) shows a section of map (b) on a linear scale to better visualize the shift of the Yoneda peak at the beginning of the growth. The white line in (a) indicates the position of the interference peak determined from the fit by the Voigt function. White dashed lines in (b) indicate the positions in q1,z0 corresponding to critical angles of pure Si and pure Ag. (c) Structural model used for the analysis of GISAXS. For explanation of the symbols, see the text. In all cases apart from the inset in (b), the intensity (colour) is plotted on a logarithmic scale.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 1| February 2026| Pages 93-107
https://doi.org/10.1107/S1600576725010726
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