Impact of substrate curvature on grazing-incidence small-angle X-ray scattering signal: theory and example of Ag thin-film growth

Kamiński, M.; Krause, B.; Abadias, G.; Coati, A.; Garreau, Y.; Michel, A.; Resta, A.; Solanki, K.; Vlad, A.; Babonneau, D.

doi:10.1107/S1600576725010726

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
The difference in q_1,z calculated for the edges of the sample (X = ±l/2), Δq_1,z, plotted against the standard q_1,z⁰ (for a point-like sample). The data correspond to $[2\Theta_{\rm f}^{0} = 0]$ and $[\alpha_{\rm i}^{0} = 0.1^{\circ}]$ and were plotted for a few sample lengths for d = 1 m.

JOURNAL OF
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CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 1| February 2026| Pages 93-107

https://doi.org/10.1107/S1600576725010726

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