Machine learning approaches for crystallographic classification from synthetic 2D X-ray diffraction data

Shahnazari, A.; Zhang, Z.; Dissanayake, S.E.; Xu, C.; Abdolrahim, N.

doi:10.1107/S1600576726000099

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 9
Classification accuracy of the proposed model-4 for each crystal system, evaluated on unseen zone axes: (a) [131], (b) [211], (c) [011] and (d) [120].

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 1| February 2026| Pages 206-224

https://doi.org/10.1107/S1600576726000099

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