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Figure 2
Sketch representation of the reflectometry suite. 1 – target/moderator; 2 – bender; 3 – chopper system; 4 – neutron guide; 5 – monitor detector; 6 – frame overlapping mirror; 7 – first collimation slit (slit 1); 8 – supermirror; 9 – polarizer; 10 – spin-flipper; 11 – magnetic guiding field; 12 – flight tube; 13 – pre-sample slit (slit 2); 14 – five-axis sample position (three translations plus two rotations) equipped with anti-vibration table; 15 – post-sample slit (slit 3); 16 – specular analyser; 17 – off-specular analyser; 18 – pre-detector slit (slit 4); 19 – detector. Units with a yellow background are under vacuum; OFFSPEC cloche – an enclosure for the pre-sample optics – is filled with helium for background suppression.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 2| April 2026| Pages 381-391
https://doi.org/10.1107/S1600576726000397
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