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Figure 6
In situ NR results of 40 nm Ta1−yFey thin films with a 4 nm Ti adhesion layer and capped with 10 nm of Pd0.6Au0.35Cu0.05 at T = 22°C. (a–c) Reflectograms of the Ta1−yFey thin films with (a) y = 0, (b) y = 0.06 and (c) y = 0.12 measured for the hydrogen pressures indicated in the legend and for increasing pressure steps. The continuous lines represent the fits of a model to the data. SLD profiles for (d) y = 0, (e) y = 0.06 and (f) y = 0.12. Reproduced from Bannenberg et al. (2024View full citation). Licenced under CC BY 4.0.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 2| April 2026| Pages 381-391
https://doi.org/10.1107/S1600576726000397
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