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![[Figure 2]](jo5129fig2mag.jpg)
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Figure 2
(a) Schematic diagram of detector panels in the simulated model, and the coordinate system used for the simulations. The positive z axis, which coincides with the X-ray beam direction, completes a right-handed coordinate system. The beam position is marked with a black dot. (b)–(d) Three representative simulated diffraction patterns, with Bragg peak locations marked by small squares. |
![[Figure 2]](jo5129fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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