view article

Figure 4
X-ray scattering background of the fixed-target supports. (A) Average of 100 images collected from chips with Mylar (6 µm) and Kapton (12.7 µm) membranes as well as in air for comparison. The data were collected at the MicroMAX beamline at MAX IV, Lund, using an energy of 12.7 keV, a flux of 5.3 × 1012 photons s−1 and a 10 ms exposure time. (B) The graphs show the mean intensity by resolution (binned into 200 resolution bins) for the averaged images in (A).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds