LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns

Sharma, H.; Sheyfer, D.; Harder, R.; Tischler, J.Z.

doi:10.1107/S1600576726001196

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
(a) Schematic drawing of the Laue diffraction experiment. The focused polychromatic beam is incident on the sample from the right. The detector is placed at $[\sim\! 90^{\circ}]$ from the X-ray beam propagation direction. (b) Transforms to take pixel position on the detector in (a) to the detector coordinate system. (c) Detector in the laboratory coordinate system defined with vectors $[{\bf T}]$ and $[{\bf R}]$ : initial position (gray) before transformation, position after translation by $[{\bf T}]$ (orange) and final position after rotation by $[{\bf R}]$ (purple).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 2| April 2026| Pages 552-563

https://doi.org/10.1107/S1600576726001196

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