LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns

Sharma, H.; Sheyfer, D.; Harder, R.; Tischler, J.Z.

doi:10.1107/S1600576726001196

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 10
Simulated diffraction pattern of an Ni sample with 19 simulated orientations. All 19 orientations were successfully indexed. The fitted peak positions are overlaid as boxes colored according to refined orientations from LaueMatching on the simulated diffraction pattern. The simulation and reconstruction parameters are given in Table 1

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 2| April 2026| Pages 552-563

https://doi.org/10.1107/S1600576726001196

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