LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns

Sharma, H.; Sheyfer, D.; Harder, R.; Tischler, J.Z.

doi:10.1107/S1600576726001196

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
Pattern-processing results for the $[\rm EuAl_{2}O_{4}]$ example. (a) Raw pattern. (b) Computed background using the repeated median. (c) Cleaned pattern. (d) Gaussian blurred pattern. No manual inputs were provided, and the procedure was run automatically to compute the inputs at each step in Fig. 3

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 2| April 2026| Pages 552-563

https://doi.org/10.1107/S1600576726001196

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