LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns

Sharma, H.; Sheyfer, D.; Harder, R.; Tischler, J.Z.

doi:10.1107/S1600576726001196

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 6
Diffraction pattern of an Ni sample with three indexed orientations. The fitted peak positions are overlaid as boxes colored according to refined orientations from LaueMatching on the cleaned diffraction pattern. Note the lack of any obvious zones for any orientation.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 2| April 2026| Pages 552-563

https://doi.org/10.1107/S1600576726001196

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