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Figure 8
Diffraction pattern of an Al sample acquired without depth resolution, resulting in heavily overlapped signals from multiple grains. The fitted peak positions for 28 distinct orientations identified by LaueMatching are overlaid as colored boxes, demonstrating the algorithm's ability to index high-multiplicity patterns common in polycrystalline samples.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 2| April 2026| Pages 552-563
https://doi.org/10.1107/S1600576726001196
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