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![[Figure 2]](yr5161fig2mag.jpg)
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Figure 2
Cross-correlation of experimental SA-ECP (Exp) with dynamical electron diffraction simulated patterns obtained using BWKD (SimBWKD) and EMSoft (SimEMSoft). (a) A small central region of the SA-ECP was used for comparison and difference plots as it carries high spatial frequency information, as shown in the inset. A similar region is shown at 19.5, 20 and 20.5 keV energies, illustrating that the diffraction geometry containing HOLZ lines is highly sensitive to beam energy. (b) The energy yielding the highest normalized XCF is the same as that for experimental SA-ECPs. |
![[Figure 2]](yr5161fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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