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Figure 2
Illustration of three sampling schemes used in PyExtal. (a) Experiment sampling. Diffraction patterns are recorded and sampled in the pixel coordinates of the detector. (b) Simulation sampling. Diffraction patterns are rotated so a user-specified reciprocal lattice vector g is parallel to the horizontal axis. The user defines the region of interest in this coordinate system by specifying the three corners of a rectangle in detector pixel coordinates and the number of sampling points per side. (c) Sampling points in (b) are used to calculate the zone-axis coordinates. (d) An example of mapping simulation sampling onto the experimental sampling of CBED. (e) An example of experimental and simulation sampling for LARBED.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 2| April 2026| Pages 687-699
https://doi.org/10.1107/S1600576726001469
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