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Figure 3
Coarse refinement with Si 111 systematic pattern. (a) Simulated LACBED pattern with field of view larger than the experiment for pattern matching. (b) Correlation map and profile along the dashed blue line. A clear peak can be identified in the profile for precise orientation search. (c) Correlation profile for different thickness. (d) Final matching results of all five reflections included in the refinement.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 2| April 2026| Pages 687-699
https://doi.org/10.1107/S1600576726001469
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