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Figure 4
(a) Si 111 systematic CBED pattern. The pattern is energy-filtered and deconvoluted with detector MTF. The intensity is square rooted to show the details in dark-field discs. (b) Comparison of experimental intensities along the white lines shown in (a) with simulated intensities calculated with refined structure factor, and the residual difference.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 2| April 2026| Pages 687-699
https://doi.org/10.1107/S1600576726001469
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