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Figure 5
Results of structure factor refinement of Si 111 systematic pattern. (a) The LACBED pattern of 000. The 125 × 25 pixel region in the white box is selected for refinement. (b) Experimental intensities extracted from the ROI and the intensities simulated with the refined structure factors. (c) Mathematical equation map for each incident beam direction. Scanning artifacts can be clearly seen along the scanning direction. (d) Difference map for each incident beam direction.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 2| April 2026| Pages 687-699
https://doi.org/10.1107/S1600576726001469
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