Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising

Guo, X.; Beniwal, D.; McLain, D.; Almer, J.; Park, J.-S.; Kenesei, P.; Sharma, H.

doi:10.1107/S1600576726007612

Figure 1
Comparison of image processing workflows. (a) Raw NF-HEDM detector image (ω = 6.75°). (b) Image after median removal (common pre-processing step, input to traditional path). (c) Traditional path after background subtraction (ten counts) and in-image median filter. (d) Traditional path, final binary image after thresholding. (e) Same raw image as panel (a). (f) Image after median removal (input to N2V path). (g) N2V path, image after applying trained N2V model. (h) N2V path, final binary image after thresholding (three counts).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007612

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