Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising

Guo, X.; Beniwal, D.; McLain, D.; Almer, J.; Park, J.-S.; Kenesei, P.; Sharma, H.

doi:10.1107/S1600576726007612

Figure 10
Generality of N2V denoising to a second material and crystal system (Ti–7Al, hexagonal, space group No. 194). A clean high signal-to-noise ratio reconstruction is used as the reference and additive read-noise of increasing magnitude (σ) is injected into the raw detector images. (a) Grain-map recall (fraction of reference voxels recovered within 5°) versus injected noise for the traditional and N2V pipelines. (b) The number of grains recovered (of 137). The N2V advantage grows with noise, while the orientation accuracy of the recovered voxels is identical between the methods (∼0.05° median) – improved completeness, not precision, reproducing the LSHR finding on a different crystal system.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007612

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