Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising

Guo, X.; Beniwal, D.; McLain, D.; Almer, J.; Park, J.-S.; Kenesei, P.; Sharma, H.

doi:10.1107/S1600576726007612

Figure 2
An enlarged comparison of image processing steps. (a) Raw image snippet. (b) After median removal. (c) Traditional result (after subtraction and median filter). (d) N2V denoised result. (e) Pixel intensity profiles along the yellow line indicated in panels (a)–(d) for raw (black), median-removed (green), traditional (blue) and N2V denoised (red). (f) Binary segmentation result from the traditional method. (g) Binary segmentation result from the N2V method. Note the recovery of the weak lower spot in panel (g) compared with panel (f).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007612

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