Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising

Guo, X.; Beniwal, D.; McLain, D.; Almer, J.; Park, J.-S.; Kenesei, P.; Sharma, H.

doi:10.1107/S1600576726007612

Figure 3
The N2V processing method yields a quantifiable increase in reconstruction confidence. (a) Confidence map from the traditional method and (b) from the N2V method. The N2V result shows visibly higher confidence values (more yellow and orange tones). (c) The pixel-wise difference map (N2V − Traditional) illustrates the improvement. The predominantly red colouring indicates a widespread increase in confidence when using the N2V method, with the average gain measured at 9%.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007612

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