Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising

Guo, X.; Beniwal, D.; McLain, D.; Almer, J.; Park, J.-S.; Kenesei, P.; Sharma, H.

doi:10.1107/S1600576726007612

Figure 4
N2V processing corrects grain shapes and reveals a systematic resizing trend. (a) An orientation map from the traditional method is compared with (b) the N2V-based map, which shows important changes in grain shape and indexing. (c) The grain size difference map (N2V size − Traditional size) illustrates the key trend. Red indicates that smaller grains are systematically reconstructed as larger with the N2V method, while blue indicates that some larger grains are slightly reduced in size at their boundaries. This is not an artefact but a correction, as the N2V method better captures the weak diffraction signals from smaller volumes. A representative grain is examined in Fig. 6

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007612

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