Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising

Guo, X.; Beniwal, D.; McLain, D.; Almer, J.; Park, J.-S.; Kenesei, P.; Sharma, H.

doi:10.1107/S1600576726007612

Figure 9
N2V recovers true diffraction signal without over-dilating spots. (a) Segmented spot counts: thresholding the raw median-removed image at three counts yields ∼10⁶ (noise-dominated) spots, versus ∼10⁴ for the N2V-denoised image and the traditional pipeline – N2V removes the noise that makes a low threshold unusable. (b) At a matched threshold, N2V spot areas are slightly smaller than raw (median ratio 0.74): denoising does not enlarge spots. (c)–(d) The additional spots recovered only by N2V are concentrated at the high-Q (top) region of the detector, where the atomic form factor suppresses higher-order reflections. (e) Mean intensity profile across ω (rocking curve), peak-aligned: the N2V-recovered high-Q spots show a coherent rise-then-fall profile like strong spots, the signature of genuine Bragg reflections rather than single-frame noise.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007612

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