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Figure 1
Convergent beam profile characterized with a Si(12 0 0) crystal (i.e. ω = 38.173°) at the sample position.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 5| October 2026|
https://doi.org/10.1107/S1600576726007181