Probing local atomic structure in thin films by grazing-incidence total X-ray scattering with a convergent X-ray beam

Yoshimoto, M.; Ito, K.; Omote, K.

doi:10.1107/S1600576726007181

Figure 5
Total scattering intensity of the ITO thin film normalized by the sum profile of the atomic scattering factor 〈 f ²〉 and the Compton scattering intensity I_inc. Red line: total scattering intensity of the ITO thin film; green line: sum profile of 〈 f ²〉 and I_inc; black solid line: 〈 f ²〉; black dashed line: I_inc.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007181

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