Probing local atomic structure in thin films by grazing-incidence total X-ray scattering with a convergent X-ray beam

Yoshimoto, M.; Ito, K.; Omote, K.

doi:10.1107/S1600576726007181

Figure 6
Comparison of S(Q) for the ITO thin film (red) and powder In₂O₃ (black). The inset also shows a zoomed-in view over 8 < Q < 21 Å⁻¹. For clarity, an offset has been applied to the S(Q) of powder In₂O₃.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007181

Open

access