Shot-noise-limited X-ray powder diffraction from organic crystals with laser-driven femtosecond X-ray source

Baranova, I.; Pulnova, Y.; Garayeva, R.; Panthi, Y.R.; Žoldák, G.; Nejdl, J.; Angelov, B.; Leonarski, F.; Andreasson, J.; Khakurel, K.

doi:10.1107/S1600576726009040

Figure 5
Integrated intensity of the transmitted beam measured with the plasma X-ray source for two random scans of 1 s in shot-to-shot mode. The Fourier transform of the plots in (a) is shown in (b).

JOURNAL OF
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CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026| Pages 1707-1713

https://doi.org/10.1107/S1600576726009040

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