Shot-noise-limited X-ray powder diffraction from organic crystals with laser-driven femtosecond X-ray source

Baranova, I.; Pulnova, Y.; Garayeva, R.; Panthi, Y.R.; Žoldák, G.; Nejdl, J.; Angelov, B.; Leonarski, F.; Andreasson, J.; Khakurel, K.

doi:10.1107/S1600576726009040

Figure 8
Comparison of PXRD profiles acquired in shot-to-shot mode and integrated mode (a) before baseline correction and (b) after baseline correction. A peak shift by 0.05 Å⁻¹ is introduced to the shot-to-shot XRD in (b) to improve the visibility of the profiles in the two different conditions.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026| Pages 1707-1713

https://doi.org/10.1107/S1600576726009040

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