Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 1
Schematic view of the investigated sample. (a) Front view and (b) top view. The arrows mark the measurement points. Diagram courtesy of the initiator of the round robin test, MEng J. Behler.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026| Pages 1407-1419

https://doi.org/10.1107/S1600576726007302

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access