Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 10
Evolution of the irradiated surface area within the groove during ψ tilting for the analysis of the hoop stress component σ_ϕϕ, showing true-to-scale representation for measurement point B (groove with central angle α = 140°). (a) AD and (b) ED diffraction mode. d denotes the respective primary beam cross section. (c) ψ-dependent correction factors (sin α_ψ/α_ψ)⁻¹ with α_ψ according to equation (6) (solid lines) and averaged correction factors 〈(sin α_ψ/α_ψ)⁻¹〉 according to equation (8) (dashed lines) for measurement points B, C and D, respectively. For further details see the main text.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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