Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 11
ED XSA carried out at point A in the x direction (cf. Fig. 1). $[a_{\psi}^{110}]$ –sin²ψ distribution obtained with detector D2. The maximum tilt angle ψ_max for all measurements performed in the ED diffraction mode was chosen as 71.5°. For the AD measurements ψ_max was calculated according to equation (7) [cf. Fig. 10(c)].

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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