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Figure 12
Residual stress depth distribution from the sin2ψ measurement in the ED diffraction mode carried out in the x direction at point A. (a) Laplace stress depth profile σ(τ). The double arrows indicate the depth ranges covered by the two detectors D1 and D2. (b) Determination of the real-space stress depth profile σ(z) by inverse Laplace transform [cf. equations (14) to (16)]. The shaded areas mark the confidence intervals in Laplace space which comprise 95% of the discrete data points.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 5| October 2026|
https://doi.org/10.1107/S1600576726007302