Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 14
Enlarged sections of Fig. 13, showing the relationship between the depth of the grooves (described by their central angle) and the differences between the uncorrected and corrected residual stresses obtained by AD diffraction.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026| Pages 1407-1419

https://doi.org/10.1107/S1600576726007302

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