Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 15
Application of the `static' and averaged factors to correct the hoop stress with regard to the rotation effect. (a) ψ dependency of the correction factors. (b) Shift of the hoop stress values obtained experimentally by AD diffraction using the `static' (red) and the averaged (green) correction factors, respectively.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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